Development of substrate-pumped nMOS protection for a 0.13 mum technology. - Craig Salling; Jerry Hu; Jeff Wu 002; Charvaka Duvvury; Roger Cline; Rith Pok (Microelectron. Reliab., 2002)

Latchup in voltage tolerant circuits: a new phenomenon. - Jorge Salcedo-Suñer; Charvaka Duvvury; Roger Cline; Alfonso Cadena-Hernandez (Microelectron. Reliab., 2004)

Gate oxide failures due to anomalous stress from HBM ESD testers. - Charvaka Duvvury; Robert Steinhoff; Gianluca Boselli; Vijay Reddy; Hans Kunz; Steve Marum; Roger Cline (Microelectron. Reliab., 2006)