Determination of the dielectric constant of materials from effective refractive index measurements. - Zulkifly Abbas; Roger D. Pollard; Robert W. Kelsall (IEEE Trans. Instrum. Meas., 1998)

A New HEMT Breakdown Model Incorporating Gate and Thermal Effects. - Lutfi Albasha; Christopher M. Snowden; Roger D. Pollard (VLSI Design, 1998)

On the feasibility of using an active tuner for measuring microwave noise parameters. - Caroline E. McIntosh; Roger D. Pollard; Robert E. Miles (IEEE Trans. Instrum. Meas., 1999)

Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide. - Zulkifly Abbas; Roger D. Pollard; Robert W. Kelsall (IEEE Trans. Instrum. Meas., 2001)

Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques. - Juan-Mari Collantes; Roger D. Pollard; Mohamed Sayed (IEEE Trans. Instrum. Meas., 2002)

Predicting CDMA spectral regrowth using a general statistical behavioural model for power amplifiers with memory effects. - T. S. L. Goh; Roger D. Pollard (ISCAS (2), 2003)

Verification of Noise-Parameter Measurements and Uncertainties. - James Randa; Joel Dunsmore; Dazhen Gu; Ken Wong; David K. Walker; Roger D. Pollard (IEEE Trans. Instrum. Meas., 2011)