Single Event Upsets and Hot Pixels in digital imagers. - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Tommy Q. Yang; Israel Koren; Zahava Koren (DFTS, 2015)

Experimental study and analysis of soft and permanent errors in digital cameras. - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Israel Koren; Zahava Koren (DFT, 2016)

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Tommy Q. Yang; Israel Koren; Zahava Koren (IMSE, 2016)

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Israel Koren; Zahava Koren (DFT, 2018)

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Parham Purbakht; Israel Koren; Zahava Koren (IMSE, 2018)

Detecting SEUs in Noisy Digital Imagers with small pixels. - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Bifei Huang; Hao Yang; Israel Koren; Zahava Koren (DFT, 2019)

Image degradation from hot pixel defects with pixel size shrinkage. - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Israel Koren; Zahava Koren (IMSE, 2019)

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Ruoyi Zhao; Israel Koren; Zahava Koren (DFT, 2020)