ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. - Bhawani Shankar; Ankit Soni; Manikant Singh; Rohith Soman; K. N. Bhat; Srinivasan Raghavan 002; Navakanta Bhat; Mayank Shrivastava (VLSID, 2017)

Integration and Characterization of High Thermal Conductivity Materials for Heat Dissipation in Stacked Devices. - W.-Y. Woon; J.-H. Jhang; K.-K. Hu; C.-C. Shih; J.-F. Hsu; J.-P. Lin; Y. Wu; Anna Kasperovich; Mohamadali Malakoutian; Rohith Soman; J. Kim; H.-K. Wei; et al. (VLSI Technology and Circuits, 2024)