Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications. - Hyungrock Oh; Attilio Belmonte; Manu Perumkunnil; Jérôme Mitard; Nouredine Rassoul; Gabriele Luca Donadio; Romain Delhougne; Arnaud Furnémont; Gouri Sankar Kar; Wim Dehaene (ESSDERC, 2021)

Process-induced charging damage in IGZO nTFTs. - Gaspard Hiblot; Nouredine Rassoul; Lieve Teugels; Katia Devriendt; Adrian Vaisman Chasin; Michiel J. van Setten; Attilio Belmonte; Romain Delhougne; Gouri Sankar Kar (IRPS, 2021)

Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control. - S. Subhechha; Nouredine Rassoul; Attilio Belmonte; Hubert Hody; Harold Dekkers; Michiel J. van Setten; Adrian Vaisman Chasin; Shamin H. Sharifi; K. Banerjee; H. Puliyalil; Shreya Kundu; M. Pak; et al. (ICICDT, 2022)

Enhanced performance and low-power capability of SiGeAsSe-GeSbTe 1S1R phase-change memory operated in bipolar mode. - Taras Ravsher; Daniele Garbin; Andrea Fantini; Robin Degraeve; Sergiu Clima; Gabriele Luca Donadio; Shreya Kundu; Hubert Hody; Wouter Devulder; Jan Van Houdt; Valeri Afanas'ev; Romain Delhougne; et al. (VLSI Technology and Circuits, 2022)

Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt > 0 V and Ion > 30 µA/µm. - S. Subhechha; Nouredine Rassoul; Attilio Belmonte; Hubert Hody; Harold Dekkers; Michiel J. van Setten; Adrian Vaisman Chasin; Shamin H. Sharifi; S. Sutar; L. Magnarin; Umberto Celano; H. Puliyalil; et al. (VLSI Technology and Circuits, 2022)

Demonstration of multilevel multiply accumulate operations for AiMC using engineered a-IGZO transistors-based 2T1C gain cell arrays. - Subhali Subhechha; Stefan Cosemans; Attilio Belmonte; Nouredine Rassoul; Shamin Houshmand Sharifi; Peter Debacker; Diederik Verkest; Romain Delhougne; Gouri Sankar Kar (IMW, 2023)

Lowest IOFF < 3×10-21 A/μm in capacitorless DRAM achieved by Reactive Ion Etch of IGZO-TFT. - Attilio Belmonte; Shreya Kundu; S. Subhechha; Adrian Vaisman Chasin; Nouredine Rassoul; Harold Dekkers; H. Puliyalil; F. Seidel; P. Carolan; Romain Delhougne; Gouri Sankar Kar (VLSI Technology and Circuits, 2023)