Modeling Thermal Laser Stimulation. - Felix Beaudoin; X. Chauffleur; Jean-Pierre Fradin; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2001)

Silicon Thinning and Polishing on Packaged Devices. - Felix Beaudoin; Philippe Perdu; Romain Desplats; Sebastien Rigo; Dean Lewis (Microelectron. Reliab., 2001)

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. - Romain Desplats; Philippe Perdu; Felix Beaudoin (Microelectron. Reliab., 2001)

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. - Felix Beaudoin; D. Carisetti; Romain Desplats; Philippe Perdu; Dean Lewis; J. C. Clement (Microelectron. Reliab., 2002)

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

IR confocal laser microscopy for MEMS Technological Evaluation. - Djemel Lellouchi; Felix Beaudoin; Christophe Le Touze; Philippe Perdu; Romain Desplats (Microelectron. Reliab., 2002)

Fault Localization using Time Resolved Photon Emission and STIL Waveforms. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Nagamani Nataraj; Ted R. Lundquist; Ketan Shah (ITC, 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Magnetic emission mapping for passive integrated components characterisation. - Olivier Crépel; Romain Desplats; Y. Bouttement; Philippe Perdu; C. Goupil; Philippe Descamps; Felix Beaudoin; L. Marina (Microelectron. Reliab., 2003)

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. - Romain Desplats; A. Eral; Felix Beaudoin; Philippe Perdu; Alan J. Weger; Moyra K. McManus; Peilin Song; Franco Stellari (Microelectron. Reliab., 2003)

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. - Mustapha Remmach; Romain Desplats; Felix Beaudoin; E. Frances; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2003)

Solar Cell Analysis with Light Emission and OBIC Techniques. - Kevin Sanchez; Romain Desplats; Guy Perez; V. Pichetto; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2003)

Femtosecond Laser Ablation for Backside Silicon Thinning. - Felix Beaudoin; J. López; M. Faucon; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2004)

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. - Olivier Crépel; Patrick Poirier; Philippe Descamps; Romain Desplats; Philippe Perdu; Gérald Haller; Abdellatif Firiti (Microelectron. Reliab., 2004)

Time Resolved Photon Emission Processing Flow for IC Analysis. - Romain Desplats; Gaël Faggion; Mustapha Remmach; Felix Beaudoin; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2004)

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. - Romain Desplats; S. Petit; Sana Rezgui; Carl Carmichael; Pascal Fouillat; Dean Lewis (Microelectron. Reliab., 2004)

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. - D. Martin; Romain Desplats; Gérald Haller; Pascal Nouet; Florence Azaïs (Microelectron. Reliab., 2004)

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? - Mustapha Remmach; Romain Desplats; Philippe Perdu; J. P. Roux; Michel Vallet; Sylvain Dudit; P. Sardin; Dean Lewis (Microelectron. Reliab., 2004)

Implementation of TRE systems into Emission Microscopes. - Alberto Tosi; Mustapha Remmach; Romain Desplats; Franco Zappa; Philippe Perdu (Microelectron. Reliab., 2004)

Dynamic Laser Stimulation Case Studies. - Felix Beaudoin; Kevin Sanchez; Romain Desplats; Philippe Perdu; Jean Marc Nicot; J. P. Roux; M. Otte (Microelectron. Reliab., 2005)

Failure analysis of micro-heating elements suspended on thin membranes. - Danick Briand; Felix Beaudoin; Jérôme Courbat; Nico F. de Rooij; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2005)

Oxide charge measurements in EEPROM devices. - C. De Nardi; Romain Desplats; Philippe Perdu; Felix Beaudoin; J.-L. Gauffier (Microelectron. Reliab., 2005)

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. - Mustapha Remmach; A. Pigozzi; Romain Desplats; Philippe Perdu; Dean Lewis; J. Noel; Sylvain Dudit (Microelectron. Reliab., 2005)

NIR laser stimulation for dynamic timing analysis. - Kevin Sanchez; Romain Desplats; Felix Beaudoin; Philippe Perdu; J. P. Roux; G. Woods; Dean Lewis (Microelectron. Reliab., 2005)

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. - Christophe De Nardi; Romain Desplats; Philippe Perdu; Jean-Luc Gauffier; Christophe Guérin (Microelectron. Reliab., 2006)