Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs. - Roméo Kom Kammeugne; Charles Leroux; Tadeu Mota Frutuoso; Jacques Cluzel; Laura Vauche; Cyrille Le Royer; Romain Gwoziecki; Xavier Garros; Fred Gaillard; Matthew Charles; Edwige Bano; Gérard Ghibaudo (ESSDERC, 2021)

Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors. - Tadeu Mota Frutuoso; Xavier Garros; Jose Lugo-Alvarez; Roméo Kom Kammeugne; L. D. M. Zouknak; Abygaël Viey; W. van den Daele; Philippe Ferrari; Fred Gaillard (IRPS, 2022)