Fast thermal fatigue on top metal layer of power devices. - Sebastiano Russo; Romeo Letor; Orazio Viscuso; Lucia Torrisi; Gianluigi Vitali (Microelectron. Reliab., 2002)

Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. - Andrea Irace; Giovanni Breglio; Paolo Spirito; Romeo Letor; Sebastiano Russo (Microelectron. Reliab., 2005)

Reliability of planar, Super-Junction and trench low voltage power MOSFETs. - Antonio Testa; Salvatore De Caro; Saverio Panarello; Salvatore Patanè; Sebastiano Russo; D. Patti; S. Poma; Romeo Letor (Microelectron. Reliab., 2010)