Improvement of immunity on MeV electron radiation of MOS structures by means of ultra-shallow fluorine implantation. - Malgorzata Kalisz; Robert Mroczynski; Romuald B. Beck (Microelectron. Reliab., 2011)

Investigation of double barrier MOS tunnel diodes with PECVD silicon quantum well. - Bogdan Majkusiak; Romuald B. Beck; Andrzej Mazurak; J. Grabowski (Microelectron. Reliab., 2011)

Reliability issues of double gate dielectric stacks based on hafnium dioxide (HfO2) layers for non-volatile semiconductor memory (NVSM) applications. - Robert Mroczynski; Romuald B. Beck (Microelectron. Reliab., 2012)

Parameter Extraction from SCLC Transport Mechanism in MIS RRAM Structures. - Muthupandian Cheralathan; Piotr Wisniewski 002; Romuald B. Beck (MIXDES, 2024)