Window for better reliability of nitride heterostructure field effect transistors. - Arvydas Matulionis; Juozapas Liberis; Emilis Sermuksnis; Linas Ardaravicius; Artur Simukovic; Cemil Kayis; Congyong Zhu; Romualdo Ferreyra; Vitaliy Avrutin; Ümit Özgür; Hadis Morkoç (Microelectron. Reliab., 2012)