A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. - Sumit DasGupta; Prabhakar Goel; Ron G. Walther; Tom W. Williams (ITC, 1982)

Chip partitioning aid: A design technique for partitionability and testability in VLSI. - Subrata Dasgupta; M. C. Graf; Robert A. Rasmussen; Ron G. Walther; Tom W. Williams (DAC, 1984)

Microprocessor Testing: Which Technique is Best? (Panel). - Jacob A. Abraham; Sandip Kundu; Janak H. Patel; Manuel A. d'Abreu; Bulent I. Dervisoglu; Marc E. Levitt; Hector R. Sucar; Ron G. Walther (DAC, 1994)

Microprocessor Test and Validation: Any New Avenues? - Magdy S. Abadir; Jacob A. Abraham; Hong Hao; C. Hunter; Wayne M. Needham; Ron G. Walther (VTS, 1997)