Low cost test point insertion without using extra registers for high performance design. - Haoxing Ren; Mary P. Kusko; Victor N. Kravets; Rona Yaari (ITC, 2009)

Structural and functional test of IBM System z10 chips. - Gerard Salem; D. W. Wittig; Thomas G. Foote; Bryan J. Robbins; C. Hirko; Donato O. Forlenza; Franco Motika; J. A. Kyle; Mary P. Kusko; Orazio P. Forlenza; R. J. Frishmuth; Rona Yaari; et al. (IBM J. Res. Dev., 2009)