MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. - Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek; Nur Engin (ICECS, 1996)

Smart sensor system application: an integrated compass. - Ronald J. W. T. Tangelder; G. Diemel; Hans G. Kerkhoff (ED&TC, 1997)

Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier. - R. H. Beurze; Y. Xing; R. van Kleef; Ronald J. W. T. Tangelder; Nur Engin (ETW, 1999)

Integrated Design and Test of Mixed-Signal Circuits. - Nur Engin; Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek (J. Electron. Test., 1999)

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. - Chris Feige; Jan Ten Pierick; Clemens Wouters; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (J. Electron. Test., 1999)

Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. - Richard Rosing; Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Manoj Sachdev (J. Electron. Test., 1999)

Design and Test Space Exploration of Transport-Triggered Architectures. - V. A. Zivkovic; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (DATE, 2000)

The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs. - V. A. Zivkovic; Ronald J. W. T. Tangelder; H. G. Herkhoff (LATW, 2000)

Modeling a Verification Test System for Mixed-Signal Circuits. - David San Segundo Bello; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (IEEE Des. Test Comput., 2001)

An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. - V. A. Zivkovic; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (J. Electron. Test., 2002)