Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. - Ronald R. Fritzemeier; Jerry M. Soden; R. Keith Treece; Charles F. Hawkins (ITC, 1990)

Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. - Jerry M. Soden; Ronald R. Fritzemeier; Charles F. Hawkins (ITC, 1990)