Information-Rich Manufacturing Metrology. - Richard K. Leach; Patrick Bointon; Xiaobing Feng 004; Simon Lawes; Samanta Piano; Nicola Senin; Danny Sims-Waterhouse; Petros Stavroulakis; Rong Su 002; Wahyudin P. Syam; Matthew Thomas (IPAS, 2018)

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. - Yassir Arezki; Rong Su 002; Ville Heikkinen; François Leprete; Pavel Psota; Youichi Bitou; Christian Schober; Charyar-Mehdi Souzani; Bandar Abdulrahman Mohammed Alzahrani; Xiangchao Zhang; Yohan Kondo; Christof Pruss; et al. (Sensors, 2021)

Task-Specific Near-Field Photometric Stereo for Measuring Metal Surface Texture. - Zhenxiong Jian; Xi Wang 023; Xinquan Zhang; Rong Su 002; Ming Jun Ren; Limin Zhu 001 (IEEE Trans. Ind. Informatics, 2024)

Profile-Aided Subaperture Stitching Algorithm for the Measurement of Microlens Array Optics by Coherence Scanning Interferometry. - Jun Guo; Yijun Shen; Xi Wang 023; Lingwen Tan; Rong Su 002; Mingjun Ren (IEEE Trans. Instrum. Meas., 2025)

In Situ Coherence Scanning Interferometry Measurement System for Large-Scale Rotationally Symmetric Aspheric Surfaces. - Yijun Shen; Jiayu Liu; Jun Yang; Duo Li; Rong Su 002; Mingjun Ren; Limin Zhu 001 (IEEE Trans. Instrum. Meas., 2025)