Test Strategy Cost Model Innovations. - Carlos Michel; Rosa D. Reinosa (ITC, 2004)

Effect of lead free solders on in-circuit test process. - Rosa D. Reinosa (ITC, 2005)

Lead Free Through Hole Technology (THT) and Contact Repeatability in In-Circuit Test. - Rosa D. Reinosa (ITC, 2006)

Characterizing mechanical performance of Board Level Interconnects for In-Circuit Test. - Rosa D. Reinosa; Aileen Allen; Elizabeth Benedetto; Alan Mcallister (ITC, 2010)