Reliability of 200mm E-mode GaN-on-Si Power HEMTs. - David C. Zhou; William Li; Jingyu Shen; Leilei Chen; Thomas Zhao; Kent Lin; Martin Zhang; Larry Chen; H. C. Chiu; Jeff Zhang 003; Roy K.-Y. Wong (IRPS, 2020)

Critical Role of Holes in Reliability, Robustness and Stability of GaN-on-Si HEMTs for Power and RF Applications. - Roy K.-Y. Wong; Yeke Liu; Po-Yen Huang; Haoran Wang; Chun-Hao Lai; Chun Chuang; Xue-Han Chen; Shawn S. H. Hsu; Chih-Kai Chang; Ming-Cheng Lin (IRPS, 2025)