Advanced methods for mechanical and structural characterization of nanoscale materials for 3D IC integration. - Christoph Sander; Yvonne Standke; Sven Niese; Rüdiger Rosenkranz; André Clausner; Martin Gall; Ehrenfried Zschech (Microelectron. Reliab., 2014)

Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation. - André Clausner; Simon Schlipf; Gottfried Kurz; Michael Otto 003; Jens Paul; Kay-Uwe Giering; Jens Warmuth; André Lange; Roland Jancke; Andreas Aal; Rüdiger Rosenkranz; Martin Gall; et al. (IRPS, 2018)