Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. - Andreas Kux; Rudolf Ullmann; Thomas Kern; Roland Strunz; Hanno Melzner; Stephan Beuven; Andreas Haase (ITC, 2014)

Robustness in automotive electronics: An industrial overview of major concerns. - Ulrich Backhausen; Oscar Ballan; Paolo Bernardi; Sergio de Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez 001; Alessandro Sansonetti; Rudolf Ullmann; et al. (IOLTS, 2017)

A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. - A. Manzini; P. Inglese; L. Caldi; R. Cantero; G. Carnevale; M. Coppetta; M. Giltrelli; N. Mautone; F. Irrera; Rudolf Ullmann; Paolo Bernardi (ETS, 2019)

Industrial best practice: cases of study by automotive chip- makers. - L. Degli Abbati; Rudolf Ullmann; G. Paganini; M. Coppetta; L. Zaia; Vincent Huard; O. Montfort; Riccardo Cantoro; Giorgio Insinga; F. Venini; P. Calao; Paolo Bernardi (DFT, 2021)

Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. - Paolo Bernardi; Giorgio Insinga; G. Paganini; Riccardo Cantoro; P. Beer; M. Coppetta; N. Mautone; G. Carnevale; Pierre Scaramuzza; Rudolf Ullmann (ETS, 2022)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. - Giorgio Insinga; M. Battilana; M. Coppetta; N. Mautone; G. Carnevale; M. Giltrelli; Pierre Scaramuzza; Rudolf Ullmann (ETS, 2023)

A graph-based algorithm for NVM address decoders testing. - Pierre Scaramuzza; Thomas Kern; Matteo Coppetta; Alessandro Grossi; Rudolf Ullmann (ITC, 2024)

Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. - Paolo Bernardi; B. Borio; Giorgio Insinga; B. Mendicino; M. Battilana; M. Coppetta; N. Mautone; Pierre Scaramuzza; F. Tengler; Rudolf Ullmann (DATE, 2025)