A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters. - Chih-Wea Wang; Ruey-Shing Tzeng; Chi-Feng Wu; Chih-Tsun Huang; Cheng-Wen Wu; Shi-Yu Huang; Shyh-Horng Lin; Hsin-Po Wang 002 (Asian Test Symposium, 2001)

Testing and Diagnosing Embedded Content Addressable Memories. - Jin-Fu Li 001; Ruey-Shing Tzeng; Cheng-Wen Wu (VTS, 2002)

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test. - Jin-Fu Li 001; Ruey-Shing Tzeng; Cheng-Wen Wu (J. Electron. Test., 2002)

Testing and Diagnosis Methodologies for Embedded Content Addressable Memories. - Jin-Fu Li 001; Ruey-Shing Tzeng; Cheng-Wen Wu (J. Electron. Test., 2003)