Clustering Subway Station Arrival Patterns Using Weighted Dynamic Time Warping. - Rui Wang 058; Nan Chen 002; Chen Zhang 007 (IEEM, 2018)

Defect pattern recognition on wafers using convolutional neural networks. - Rui Wang 058; Nan Chen 002 (Qual. Reliab. Eng. Int., 2020)

Similarity searching for fault diagnosis of defect patterns in wafer bin maps. - Rui Wang 058; Songhao Wang (Comput. Ind. Eng., 2023)

Competitive multi-task Bayesian optimization with an application in hyperparameter tuning of additive manufacturing. - Songhao Wang; Weiming Ou; Zhihao Liu; Bo Du; Rui Wang 058 (Expert Syst. Appl., 2025)

A Global Adversarial and Local Contrastive Transfer Learning Approach for Remaining Useful Life Prediction. - Zengwei Yuan; Shichang Du; Rui Wang 058; Xin Wang 107 (IEEE Trans. Instrum. Meas., 2025)