Flip-flops soft error rate evaluation approach considering internal single-event transient. - Ruiqiang Song; Shuming Chen; Yibai He; Yankang Du (Sci. China Inf. Sci., 2015)

Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits. - Jingyan Xu; Shuming Chen; Pengcheng Huang 003; Peipei Hao; Ruiqiang Song; Chunmei Hu (IEICE Electron. Express, 2015)

Comparison of single-event upset generated by heavy ion and pulsed laser. - Bin Liang; Ruiqiang Song; Jianwei Han; Yaqing Chi; Rui Chen; Chunmei Hu; Jianjun Chen; Yingqi Ma; Shipeng Shangguan (Sci. China Inf. Sci., 2017)

Modeling the impact of process and operation variations on the soft error rate of digital circuits. - Ruiqiang Song; Shuming Chen; Bin Liang; Yaqing Chi; Jianjun Chen (Sci. China Inf. Sci., 2017)

A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (ASICON, 2019)

Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient. - Xiaoyu Zhang; Bin Liang; Ruiqiang Song (ASICON, 2019)

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (IEICE Electron. Express, 2019)

Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. - Jingyan Xu; Yang Guo 003; Ruiqiang Song; Bin Liang; Yaqing Chi (Symmetry, 2019)

MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (IEICE Electron. Express, 2020)

Machine Learning based SET Propagation Prediction for Large Scale Integrated Circuits. - Ruiqiang Song; Jiageng Shi; Jinjin Shao; Xiaoyu Zhang (ASICON, 2021)