Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm. - Tong Sang; Dai Sun; Wei Zhao 035; Ruohui Chen; Zeng Zeng (CIS-RAM, 2023)

Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information. - Xiaoyan Zheng; Tong Sang; Ruohui Chen; Zeng Zeng (CIS-RAM, 2023)