Effect of scaling on noise in Circular Gate TFET and its application as a digital inverter. - Rupam Goswami; Brinda Bhowmick; Srimanta Baishya (Microelectron. J., 2016)

Optimization of ferroelectric tunnel junction TFET in presence of temperature and its RF analysis. - Puja Ghosh; Rupam Goswami; Brinda Bhowmick (Microelectron. J., 2019)

Parametric investigation and trap sensitivity of n-p-n double gate TFETs. - Deepjyoti Deb; Rupam Goswami; Ratul Kr. Baruah; Kavindra Kandpal; Rajesh Saha (Comput. Electr. Eng., 2022)

Impact on performance of dual stack hetero- gated dielectric modulated TFET biosensor due to Si1-xGex pocket variation. - Ayush Mangla; Rajesh Saha; Rupam Goswami (Microelectron. J., 2022)

Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. - Rajesh Saha; Rupam Goswami; Deepak Kumar Panda (Microelectron. J., 2022)

Fin core dimensionality and corner effect in dual core gate-all-around FinFET. - Prachuryya Subash Das; Deepjyoti Deb; Rupam Goswami; Santanu Sharma; Rajesh Saha (Microelectron. J., 2024)