High-yield assembly of multichip modules through known-good IC's and effective test strategies. - John K. Hagge; Russell J. Wagner (Proc. IEEE, 1992)

Design-For-Test Techniques Utilized in an Avionics Computer MCM. - Russell J. Wagner; Joel A. Jorgenson (ITC, 1993)

Analyzing the design-for-test techniques in a multiple substrate MCM. - Joel A. Jorgenson; Russell J. Wagner (VTS, 1994)

Design-For-Test in a Multiple Substrate Multichip Module. - Joel A. Jorgenson; Russell J. Wagner (J. Electron. Test., 1997)