A scanning tunneling microscope for surface science studies. - Joseph E. Demuth; Robert J. Hamers; Ruud M. Tromp; Mark E. Welland (IBM J. Res. Dev., 1986)

Application of electron and ion beam analysis techniques to microelectronics. - Tung-Sheng Kuan; Philip E. Batson; Randall M. Feenstra; Alan J. Slavin; Ruud M. Tromp (IBM J. Res. Dev., 1992)