Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs. - Cosette Y. H. Lin; Ryan H.-M. Huang; Charles H.-P. Wen; Austin C.-C. Chang (VLSI-DAT, 2013)

CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate. - Austin C.-C. Chang; Ryan H.-M. Huang; Charles H.-P. Wen (IEEE Trans. Very Large Scale Integr. Syst., 2013)

Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation. - Jerry C. Y. Ku; Ryan H.-M. Huang; Louis Y.-Z. Lin; Charles H.-P. Wen (ASP-DAC, 2014)

Advanced Soft-Error-Rate (SER) Estimation with Striking-Time and Multi-Cycle Effects. - Ryan H.-M. Huang; Charles H.-P. Wen (DAC, 2014)

CASTA: CUDA-Accelerated Static Timing Analysis for VLSI Designs. - Hunta H.-W. Wang; Louis Y.-Z. Lin; Ryan H.-M. Huang; Charles H.-P. Wen (ICPP, 2014)

TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits. - Sung S.-Y. Hsueh; Ryan H.-M. Huang; Charles H.-P. Wen (ISQED, 2014)

TA-FTA: transition-aware functional timing analysis with a four-valued encoding. - Jasper C. C. Chang; Ryan H.-M. Huang; Louis Y.-Z. Lin; Charles H.-P. Wen (DAC, 2015)

A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs. - Ryan H.-M. Huang; Dennis K.-H. Hsu; Charles H.-P. Wen (J. Electron. Test., 2015)

Coupling-Aware Functional Timing Analysis for Tighter Bounds: How Much Margin Can We Relax? - Jack S.-Y. Lin; Louis Y.-Z. Lin; Ryan H.-M. Huang; Charles H.-P. Wen (ACM Great Lakes Symposium on VLSI, 2017)