Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency. - Ryo Sakamaki; Masahiro Horibe (IEEE Trans. Instrum. Meas., 2018)

Transmission loss of screen-printed metallization at millimeter-wave frequency. - Ryo Sakamaki; Masahiro Horibe; Manabu Yoshida (IEICE Electron. Express, 2019)

Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process. - Ryo Sakamaki; Masahiro Horibe (IEEE Trans. Instrum. Meas., 2019)

Electromagnetic Measurement Techniques for Materials and Device Used in 6G Wireless Communications. - Masahiro Horibe; Yuto Kato; Ryo Sakamaki (6G SUMMIT, 2020)

Precision Adjustment of Probe-Tilt Angle With RF Signal Detection Technique. - Ryo Sakamaki; Masahiro Horibe (IEEE Trans. Instrum. Meas., 2020)

Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz. - Ryo Sakamaki; Masahiro Horibe (IEEE Trans. Instrum. Meas., 2021)