Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy. - Norimich Chinone; Ryoji Kosugi; Yasunori Tanaka; Shinsuke Harada; Hajime Okumura; Yasuo Cho (Microelectron. Reliab., 2016)

Influence of SiC epitaxial wafer quality on yield of 1.2kV SiC-DMOSFETs. - Junji Senzaki; Ryoji Kosugi; Keiko Masumoto; Takeshi Mitani; Takeharu Kuroiwa; Hiroshi Yamaguchi (IRPS, 2022)