Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm. - Jun Furuta; Ryosuke Yamamoto; Kazutoshi Kobayashi; Hidetoshi Onodera (A-SSCC, 2011)

Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures. - Chikara Hamanaka; Ryosuke Yamamoto; Jun Furuta; Kanto Kubota; Kazutoshi Kobayashi; Hidetoshi Onodera (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2011)

A Radiation-Hard Redundant Flip-Flop to Suppress Multiple Cell Upset by Utilizing the Parasitic Bipolar Effect. - Kuiyuan Zhang; Jun Furuta; Ryosuke Yamamoto; Kazutoshi Kobayashi; Hidetoshi Onodera (IEICE Trans. Electron., 2013)

TokyoTech at TRECVID 2015. - Nakamasa Inoue; Hai Dang Tran; Ryosuke Yamamoto; Koichi Shinoda (TRECVID, 2015)

TokyoTech at TRECVID 2016. - Nakamasa Inoue; Ryosuke Yamamoto; Na Rong; Koichi Shinoda (TRECVID, 2016)

TokyoTech-AIST at TRECVID 2017: Multimedia Event Detection Using Deep CNNs and Zero-Shot Classiers. - Nakamasa Inoue; Ryosuke Yamamoto; Na Rong; Satoshi Kanai; Junsuke Masada; Chihiro Shiraishi; Shi-wook Lee; Koichi Shinoda (TRECVID, 2017)

Exploring Display Parameters Associated with Cybersickness Using Electroencephalography. - Yasufumi Nakata; Mayuka Otsuki; Minori Sakai; Miki Nagai; Ryosuke Yamamoto; Atsushi Aoyama (VR Workshops, 2025)