Physical random number generator based on MOS structure after soft breakdown. - Shinichi Yasuda; Hideki Satake; Tetsufumi Tanamoto; Ryuji Ohba; Ken Uchida; Shinobu Fujita (IEEE J. Solid State Circuits, 2004)

Physical random number generators for cryptographic application in mobile devices. - Shinichi Yasuda; Tetsufumi Tanamoto; Ryuji Ohba; Keiko Abe; Hanae Nozaki; Shinobu Fujita (ESSCIRC, 2005)

Si Nanocrystal MOSFET with Silicon Nitride Tunnel Insulator for High-rate Random Number Generation. - Ryuji Ohba; Daisuke Matsushita; Koichi Muraoka; Shinichi Yasuda; Tetsufumi Tanamoto; Ken Uchida; Shinobu Fujita (ISVLSI, 2006)

1200μm2 Physical Random-Number Generators Based on SiN MOSFET for Secure Smart-Card Application. - Mari Matsumoto; Shinichi Yasuda; Ryuji Ohba; Kazutaka Ikegami; Tetsufumi Tanamoto; Shinobu Fujita (ISSCC, 2008)