A Practical Test System with a Fuzzy Logic Controller. - Takeshi Koyama; Ryuji Ohmura (IEICE Trans. Inf. Syst., 1995)

A 12-ps-resolution digital variable-delay macro cell on GaAs 100 K-gates gate array using a meshed air bridge structure. - Akira Ohta; Norio Higashisaka; Tetsuya Heima; Takayuki Hisaka; Hirofumi Nakano; Ryuji Ohmura; Tadashi Takagi; Noriyuki Tanino (IEEE J. Solid State Circuits, 1999)

Test cost reduction by at-speed BISR for embedded DRAMs. - Yoshihiro Nagura; Michael Mullins; Anthony Sauvageau; Yoshinoro Fujiwara; Katsuya Furue; Ryuji Ohmura; Tatsunori Komoike; Takenori Okitaka; Tetsushi Tanizaki; Katsumi Dosaka; Kazutami Arimoto; Yukiyoshi Koda; et al. (ITC, 2001)