Au/SnO2/n-Si (MOS) structures response to radiation and frequency. - Adem Tataroglu; S. Altindal; S. Karadeniz; N. Tugluoglu (Microelectron. J., 2003)

Dielectric properties in Au/SnO2/n-Si (MOS) structures irradiated under 60Co-gamma rays. - N. Tugluoglu; S. Altindal; A. Tataroglu; Serdar Karadeniz (Microelectron. J., 2004)

A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range. - H. Altuntas; S. Altindal; H. Shtrikman; Suleyman Özçelik (Microelectron. Reliab., 2009)

On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. - S. Demirezen; S. Altindal; Suleyman Özçelik; Ekmel Özbay (Microelectron. Reliab., 2011)

On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures. - Z. Tekeli; Muharrem Gökçen; S. Altindal; Suleyman Özçelik; Ekmel Özbay (Microelectron. Reliab., 2011)