Temperature stability of a piezoresistive MEMS resonator including self-heating. - S. Bendida; J. J. Koning; J. J. M. Bontemps; J. T. M. van Beek; D. Wu; Marcel A. J. van Gils; S. Nath (Microelectron. Reliab., 2008)

Packaging influences on the reliability of MEMS resonators. - Jeroen J. M. Zaal; W. D. van Driel; S. Bendida; Q. Li; J. T. M. van Beek; G. Q. Zhang (Microelectron. Reliab., 2008)