Design and analysis of delay control for CBR services in ATM networks. - Y. C. Chen; C. T. Chan; S. C. Hu (Comput. Commun., 1998)

Mechanical design and analysis of direct-plated-copper aluminum nitride substrates for enhancing thermal reliability. - Ming-Yi Tsai; P. S. Huang; C. H. Lin; C. T. Wu; S. C. Hu (Microelectron. Reliab., 2015)

Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications. - Ming-Yi Tsai; C. H. Lin; K. F. Chuang; Y. H. Chang; C. T. Wu; S. C. Hu (Microelectron. Reliab., 2016)