Ionising radiation effects on MOSFET drain current. - S. Cimino; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2003)

Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. - P. Srinivasan; Rakesh Ranjan; S. Cimino; A. Zainuddin; B. Kannan; L. Pantisano; I. Mahmud; G. Dilliway; Tanya Nigam (IRPS, 2018)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Improved HCI in SOI-based next generation RF Power Amplifier FETs using device optimization approach. - O. H. Gonzalez; P. Srinivasan; S. Cimino; K. Shanbhag; S. Jain (IRPS, 2025)