Automated Contactless Digital Test System for VLSI. - K. Thangamuthu; M. Macari; S. Cohen (ITC, 1982)

Knowledge-Based Teams: Technology, Reinvention and Critical Process Redesign. - Tora K. Bikson; J. D. Eveland; S. Cohen; D. Mankin (HCI (1), 1997)

The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics. - J. R. Lloyd; C. E. Murray; S. Ponoth; S. Cohen; E. Liniger (Microelectron. Reliab., 2006)