A new test pattern generation method for delay fault testing. - S. Cremoux; Christophe Fagot; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch (VTS, 1996)

Delay-power performance analysis. - S. Cremoux; M. Aline; Nadine Azémard; Daniel Auvergne (ICECS, 1999)