On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. - S. Demirezen; S. Altindal; Suleyman Özçelik; Ekmel Özbay (Microelectron. Reliab., 2011)