An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Vincent Pouget; Pascal Fouillat; Dean Lewis; Hervé Lapuyade; L. Sarger; F. M. Roche; S. Duzellier; R. Ecoffet (IOLTW, 2000)

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. - Corinne Bestory; François Marc; S. Duzellier; Hervé Levi (Microelectron. Reliab., 2009)