Reducing Iron Loss in Interior PM Machines under Field-Weakening Conditions. - Wen L. Soong; S. H. Han; Thomas M. Jahns; Nesimi Ertugrul (IAS, 2007)

Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node. - S. Ko; J. H. Park; J. H. Bak; H. Jung; J. Shim; D. S. Kim; W. Lim; D.-E. Jeong; J. H. Lee; K. Lee; J.-H. Park; Y. Kim; et al. (VLSI Technology and Circuits, 2023)

Semigroup structures via IVI-octahedron sets. - J. I. Baek; G. Muhiuddin; S. H. Han; K. Hur (Discret. Math. Algorithms Appl., 2024)