Reliability for Recessed Channel Structure n-MOSFET. - J. Y. Seo; K. J. Lee; Y. S. Kim; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)

Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics. - J. Y. Seo; K. J. Lee; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)

Dynamic Indoor Localization Based on Active RFID for Healthcare Applications: A Shape Constraint Approach. - Wei-Hong Chen; Herbert H. Chang; Tzong-Huei Lin; Po-Chou Chen; L. K. Chen; S. J. Hwang; David Hung-Tsang Yen; Hanna S. Yuan; Woei-Chyn Chu (BMEI, 2009)