Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm. - S. Jayanthy; M. C. Bhuvaneswari; Keesarapalli Sujitha (VLSI Design, 2012)

Simulation-based ATPG for low power testing of crosstalk delay faults in asynchronous circuits. - S. Jayanthy; M. C. Bhuvaneswari; M. Prabhu (Int. J. Comput. Appl. Technol., 2013)

An Embedded System for Smart Farming Using Machine Learning Approaches. - R. Dhaya Sree; A. Arun Raja; S. Jayanthy (ICCCSP, 2023)

An optimized deep learning approach to detect and classify defective tiles in production line for efficient industrial quality control. - J. Judeson Antony Kovilpillai; S. Jayanthy (Neural Comput. Appl., 2023)