Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures. - P. Ravindran; Nicola J. Ferrier; S. M. Park; P. F. Nealey (ICIP (4), 2007)

A 4-channel 12.5Gb/s Common-Gate Transimpedance Amplifier Array for DVI/HDMI Applications. - Kang-Yeob Park; Wonseok Oh 003; Boo-Young Choi; Jung-Won Han; S. M. Park (ISCAS, 2007)

Ongoing Evolution of DRAM Scaling via Third Dimension -Vertically Stacked DRAM -. - Jung-Won Han; S. H. Park; Moonyoung Jeong; K. N. Kim; H. J. Kim; J. C. Shin; S. M. Park; S. H. Shin; S. W. Park; K. S. Lee; J. H. Lee; S. H. Kim; et al. (VLSI Technology and Circuits, 2023)

A Three Dimensional DRAM (3D DRAM) Technology for the Next Decades. - K. S. Choi; S. H. Kim; J. W. Seo; H. S. Kang; Seung Wan Chu; S. W. Bae; J. H. Kwon; G. S. Kim; Y. T. Park; J. H. Kwak; D. I. Song; S. M. Park; et al. (VLSI Technology and Circuits, 2024)

Melting phenomena of self-organized magnetic structures investigated by variational autoencoder. - Han Gyu Yoon; D. B. Lee; S. M. Park; J. W. Choi; Hee Young Kwon; Changyeon Won (Comput. Phys. Commun., 2024)