Test circuits for fast and reliable assessment of CDM robustness of I/O stages. - Wolfgang Stadler; Kai Esmark; K. Reynders; M. Zubeidat; Michael Graf; Wolfgang Wilkening; J. Willemen; Ning Qu; S. Mettler; M. Etherton (Microelectron. Reliab., 2005)

Study of CDM specific effects for a smart power input protection structure. - M. Etherton; Ning Qu; J. Willemen; Wolfgang Wilkening; S. Mettler; Mariano Dissegna; R. Stella; L. Zullino; A. Andreini; Horst A. Gieser (Microelectron. Reliab., 2006)

Verification of CDM circuit simulation using an ESD evaluation circuit. - M. Etherton; J. Willemen; Wolfgang Wilkening; Ning Qu; S. Mettler; Wolfgang Fichtner (Microelectron. Reliab., 2007)