A framework for inferential problems in DEDS. II. State observation. - Prodip Bhowal; S. Mukhopadhay; Anupam Basu (SMC, 2000)

A framework for inferential problems in DEDS. III. Fault diagnosis. - S. Mukhopadhay; Prodip Bhowal; Anupam Basu (SMC, 2000)

A framework for inferential problems in DEDS. I. TTM based modeling. - S. Mukhopadhay; Prodip Bhowal; Anupam Basu (SMC, 2000)

Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. - M. Jamil; S. Mukhopadhay; M. Ghoneim; A. Shailos; Chetan Prasad; Inanc Meric; Stephen Ramey (IRPS, 2023)