Correlation method of circuit-performance and technology fluctuations for improved design reliability. - D. Miyawaki; Shizunori Matsumoto; Hans Jürgen Mattausch; S. Ooshiro; Masami Suetake; Mitiko Miura-Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (ASP-DAC, 2001)

Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. - Shizunori Matsumoto; Hans Jürgen Mattausch; S. Ooshiro; Y. Tatsumi; Mitiko Miura-Mattausch; Shigetaka Kumashiro; Terufumi Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (CICC, 2001)