Weighted random test program generation for a per-pin tester. - Jeff Gartner; B. Driscoll; Donato O. Forlenza; Orazio P. Forlenza; Timothy J. Koprowski; T. Lizambri; R. Olsen; S. Robertson; P. Ryan; A. Walter (ITC, 1990)

AT&T - BT - KDD international ISDN. - Eligio Clapcich; Steven D. Akers; Ken-ichi Nishimura; S. Robertson (NOMS, 1992)