Direct Temperature Measurement for VLSI Circuits and 3-D Modeling of Self-Heating in Sub-0.13 mum SOI Technologies. - Rajiv V. Joshi; S. S. Kang; N. Zamdmar; Anda Mocuta; Ching-Te Chuang; J. A. Pascual-Gutiérrez (VLSI Design, 2005)