Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. - Jean-Luc Autran; Daniela Munteanu; Philippe Roche; Gilles Gasiot; S. Martinie; S. Uznanski; S. Sauze; S. Semikh; Evgeny Yakushev; S. Rozov; Pia Loaiza; G. Warot; et al. (Microelectron. Reliab., 2010)